IRLabs will showcase the failure analysis capabilities of our photon emission microscopy for the semiconductor industry at the 49th International Symposium for Testing and Failure Analysis (ISTFA), the premier event for the microelectronics failure analysis community, at the Phoenix Convention Center, November 12-16, 2023, in Phoenix, Arizona. The exhibition hall is open November 14-15.
Our IREM systems solve the toughest infrared photon emission FA problems, providing the highest signal to noise backside failure analysis, debug and yield enhancement with unprecedented visibility of the faintest IR emissions. We offer full line of affordable photo and thermal emission IR microscopes, optics, motion control and fault localization software. For over 20 years, IRLabs has worked with the world’s leading semiconductor companies to provide and support the industry’s most sensitive photon emission FA tools.
Visit us in Booth #209 to learn more.
