Help us solve your challenge of detecting faults in complex integrated circuits.

We offer a free test of your device using the IREM-IV and will review the results with you.

Here are a few of the items we would need to receive to perform the test:

  • Device
  • Instructions on how to power it
  • Areas of interest
  • Device and process node size
  • Silicon backside thickness
  • Confidentiality or non-disclosure agreements

Once the test is complete, we will schedule a call with you to review the results.

We’re also happy to schedule a remote session for you to observe the test, or we can schedule a time for you to visit our lab if you would like firsthand experience running the IREM-IV system.

Please complete the form below and we will contact you to discuss your device and testing requirements.

HIGHEST RESOLUTION Debug 10 nm Process

HIGHEST RESOLUTION
Debug 10 nm Process

MOST SENSITIVE Image 400 mV Emissions

MOST SENSITIVE
Image 400 mV Emissions

LARGEST FIELD OF VIEW Custom Optics

LARGEST FIELD OF VIEW
Custom Optics

Overlay showing emissions

EMISSIONS OVERLAY

Please complete the form and we will contact you to discuss your device and testing requirements.