{"id":2362,"date":"2024-01-31T13:51:23","date_gmt":"2024-01-31T20:51:23","guid":{"rendered":"https:\/\/www.irlabs.com\/?page_id=2362"},"modified":"2024-02-21T16:08:17","modified_gmt":"2024-02-21T23:08:17","slug":"automated-wafer-prober","status":"publish","type":"page","link":"https:\/\/www.irlabs.com\/products\/failure-analysis\/automated-wafer-prober\/","title":{"rendered":"Automated Wafer Prober"},"content":{"rendered":"
After initial alignment, the Automated Wafer Prober will activate each test site on a wafer automatically, accurately, and quickly. Setup parameters are stored for ongoing and future testing and analysis. A new alignment microscope adds ease and accuracy to the initial setup and fine alignment.<\/p>\n
Using AIRIS Wafer Stage and Wafer Navigation software, users can program the wafer stage XY axes and the prober Z axis. After initial setup, the wafer prober will operate automatically to test the full wafer in a fraction of the time of manual probing.<\/p>\n<\/div><\/div><\/div>