IREM-II PE

Utilizing a high sensitivity InGaAs focal plane array and proprietary high numerical aperture optics, IREM-II PE (NG-IREM) is Infrared Laboratories advanced emission microscope. Optimized for photoemission applications between 1µm and 1.5 µm emission wavelength, IREM-II PE has unmatched signal-to-noise ratio and sensitivity. Faint emissions of sub 1-volt devices can be detected within a very short integration time. IREM-II PE uses the same advanced Infrared Imaging Software (AIRIS) utilized by IREM-I to improve fault localization and spatial resolution capabilities.

The IREM-II PE product, while optimized for photoemission applications, allows for easy "swapping" to thermal emission microscopy applications utilizing the IREM-I MCT detection system.