IREM Products

IREM emission microscopes were developed by Infrared Laboratories for the semiconductor industry in 1996 to provide backside failure analysis, yield enhancement and debug with unprecedented visibility to the faintest levels of near-IR emission . Our high sensitivity optical diagnostic platform for backside/substrate imaging provides extremely high signal-to-noise ratios and exceptional spatial resolution to detect and locate abnormal emission conditions. With its highly sensitive array detectors, high numerical aperture (NA) IR optics designs, and advanced fault localization software capabilities, the IREM dramatically eases the difficult and time-consuming process of global fault localization.

The IREM product line is now available through our Sales and Marketing partner, MotionX Corporation. John Van Dyke, MotionX's VP-Sales and Marketing will be the coordinator of all "IREM" related product Sales and Marketing activities, and the first point of contact. Please send any questions to John at jvandyke@motionx.org or call him directly at (805) 968-2001. Interested parties are invited to visit IRLabs where our IREM engineers will give a full demonstration of the capabilities of our Infrared Emission Microscope. Please call IRLabs to set up an appointment.

In collaboration with MotionX Corporation, IRLabs now provides unmatched customer service and a renewable warranty on all IREM products.

Related Link: Electronic Device Failure Analysis Society (EDFAS)
The goal of this organization is to foster education and communication in the failure analysis community, working for technology advancement and the improved performance and reliability of devices and materials for the electronic industry.