IREM Systems for Semiconductor FA/Debug
+1 (520) 622-7074  |  sales@irlabs.com

Optics Subsystems

Image 90nm device. 25x Lens 4x4 Mosaic / SIL Overlay Image / SIL detail 257nm line spacing
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IREM Systems

IREM-SIL  
IREM-II

IREM-SIL Subsystems  
Optics
Motion & Electronics
AIRIS Software

Upgrades  
IREM-I to SIL
IREM-II to SIL
Camera/Detector (Integrated Dewar Assembly)
IRLabs  0.3 macro lens 1x, 10x, 25x, 100x, LIO, SIL, and other magnification.The world’s highest signal-to-noise ratio camera in our proprietary ULN Image Sensor.
The proprietary InGaAs-based focal plane array (FPA) with unmatched signal-to-noise ratio, makes this the most sensitive Infrared Emission camera in the industry

Combined with our high numerical aperture near-IR optimized lenses, it allows you to detect and localize even the faintest emission sites indicative of defects faster and more accurately.

Lens
The highest optical quality in the industry.
Our lenses deliver unmatched precision in locating potential faults.
  • Highest transmission and resolution SILs designed for 1.1um to 1.6um operations.
  •  0.3 macro lens 1x, 10x, 20x, 25x, 100x, LIO, SIL, and other magnification.