IREM Systems for Semiconductor FA/Debug
+1 (520) 622-7074  |  sales@irlabs.com

IREM-SIL

Image 90nm device. 25x Lens 4x4 Mosaic / SIL Overlay Image / SIL detail 257nm line spacing
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IREM Systems

IREM-SIL  
IREM-II

IREM-SIL Subsystems  
Optics
Motion & Electronics
AIRIS Software

Upgrades  
IREM-I to SIL
IREM-II to SIL
IREM-SIL Systems
The world’s most sensitive, highest lateral resolution InGaAs-based IREM

The IREM-SIL, built on the core technology of its predecessor, the IREM-II, enables unprecedented resolution and imaging for deep sub-micron levels required today and in the future.


Superior optics
  Resolution.
Detector/Camera
  • Proprietary ULN Image Sensor
  • Lowest noise, highest SNR
 
Lenses
  • 1.1µm - 1.6µm operations
  • 0.3x macro lens, 1x, 10x, 25x, 100x, LIO, 2.8 NA SIL, and more
  • Highest transmission and resolution SIL (<150nm)
100nm lens slide   Repeatability.
Motion System
  • 8-axis
  • Ultra-low parcentricity error enables precise localization (<0.5µm repeatability
 
AIRIS Software
  • Interface to 3rd-party software including CADNav
  • Developed over 14 years with industry input
AIRIS Software
  Reliability.
  • Uptime >97% worldwide
  • Consistent data