IREM Systems for Semiconductor FA/Debug
+1 (520) 622-7074  |  sales@irlabs.com

AIRIS Software

Image 90nm device. 25x Lens 4x4 Mosaic / SIL Overlay Image / SIL detail 257nm line spacing
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IREM Systems

IREM-SIL  
IREM-II

IREM-SIL Subsystems  
Optics
Motion & Electronics
AIRIS Software

Upgrades  
IREM-I to SIL
IREM-II to SIL
AIRIS Software
Our IREM-SIL is fully supported by AIRIS, our Advanced Infrared Emission Imaging Software.
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  • Designed from our 14 years of IREM expertise and customer input
  • Based on image-processing functions based on techniques originally developed for astronomical application
  • Algorithms enhance spatial resolution and localization to help optimize signal-to-noise along with real-time image conditioning such as precision flat-fielding
  • Hardware operations are well integrated with the software to yield optimum results
Display and Imaging Functions
  • Advanced Mosaic features to enhance efficiency of large die imaging
  • Overlay emission images, illuminated device images, and CAD data/polygons to find problems faster
  • Region of Interest (ROI)  - select and analyze a device area or sub-field
  • Sub-stepping, deconvolution, digital zoom
  • Advanced imaging features for more speed and accuracy.
  • Post-processing tools
Navigation Functions
  • GUI interface designed for FA/debug engineers
  • CADNav features for easier overlay configuration
  • More automated features to save time and increase accuracy
  • Stage and lens slide control features to improve speed and crash safety
  • Panning, absolute move, relative move, reference points, point database, chip profile
  • Hot keys for faster operations
Contact us at sales@irlabs.com for more in AIRIS.